A. De Martino

Accurate dimensional characterization of periodic structures by spectroscopic Mueller polarimetry

J. Foucher, J. Hazart, M. Foldyna, 2008, Lithography Asia.

Optics of nanogratings

A. De Martino, K. Postava, J. Pištora, 2007, Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics.

Robust characterization of small grating boxes using rotating stage Mueller matrix polarimeter

J. Foucher, M. Foldyna, A. De Martino, 2010, Advanced Lithography.

Characterization of inhomogeneous samples by spectroscopic Mueller polarimetry

M. Foldyna, A. De Martino, D. Cattelan, 2008, Lithography Asia.

Contrast evaluation of the polarimetric images of different targets in turbid medium: possible sources of systematic errors

A. De Martino, T. Novikova, A. Bénière, 2010, Defense + Commercial Sensing.

Stability of polarimetric grating characterization with beam spot larger than grating box

M. Foldyna, A. De Martino, C. Licitra, 2010, Advanced Lithography.

Mueller polarimetry in the back focal plane

A. De Martino, M. Foldyna, S. Ben Hatit, 2007, SPIE Advanced Lithography.

Comparison of spectroscopic Mueller polarimetry, standard scatterometry, and real space imaging techniques (SEM and 3D-AFM) for dimensional characterization of periodic structures

J. Foucher, J. Hazart, M. Foldyna, 2008, SPIE Advanced Lithography.