Dahye Min

Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit

Seungbae Lee, Taiki Uemura, Soonyoung Lee, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET

Seungbae Lee, Taiki Uemura, Soonyoung Lee, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).