M. T. Kief

In-situ ellipsometry: applications to thin film research, development, and production

M. T. Kief, M. Kief, 1999, Optics + Photonics.

Finite‐size scaling behavior of ferromagnetic thin films

Gary J. Mankey, M. T. Kief, R. F. Willis, 1993 .

Giant magnetoresistance in CoFe/Cu multilayers with different buffer layers and substrates

M. T. Kief, S. Gangopadhyay, M. R. Parker, 1995 .