C. E. Soh
发表
J. C. H. Phang,
J. M. Chin,
D. S. H. Chan,
2001,
Microelectron. Reliab..
J.C.H. Phang,
Glen Gilfeather,
C. E. Soh,
2000,
2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).
J.C.H. Phang,
M. Palaniappan,
G. Gilfeather,
2001,
Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548).
C. E. Soh,
Z. Mai,
M. Palaniappan,
2001,
Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548).