R. Setia

Run-to-run failure detection and diagnosis using neural networks and Dempster-Shafer theory: an application to excimer laser ablation

G.S. May, R. Setia, R. Setia, 2006, IEEE Transactions on Electronics Packaging Manufacturing.

Sensitivity analysis and optimization of excimer laser ablation for microvia formation using neural networks and genetic algorithms

R. Setia, V. Sundaram, G.S. May, 2004, IEEE/CPMT/SEMI 29th International Electronics Manufacturing Technology Symposium (IEEE Cat. No.04CH37585).

Neural network modeling of the resistance of metallized vias formed by laser ablation in polymer dielectrics

G. S. May, R. Setia, 2003, Proceedings of the 15th Biennial University/Government/ Industry Microelectronics Symposium (Cat. No.03CH37488).

Modeling and optimization of via formation in dielectrics by laser ablation using neural networks and genetic algorithms

R. Setia, G.S. May, 2004, IEEE Transactions on Electronics Packaging Manufacturing.