D. Meyersdorf

Effective measurement and evaluation of R&D quality and productivity

D. Meyersdorf, E. Dar-El, Z. Bonen, 1999, PICMET '99: Portland International Conference on Management of Engineering and Technology. Proceedings Vol-1: Book of Summaries (IEEE Cat. No.99CH36310).

A STRATEGIC DOMAIN : IE IN THE SEMICONDUCTOR INDUSTRY

D. Meyersdorf, J. M. Padillo, 1998 .

Cycle time reduction for semiconductor wafer fabrication facilities

D. Meyersdorf, T. Yang, T. Yang, 1997, 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings.

Fab layout design methodology : Case of the 300 mm fabs

D. Meyersdorf, A. Taghizadeh, A. Taghizadeh, 1998 .

Simulation of test wafer consumption in a semiconductor facility

D. Meyersdorf, J. M. Padillo, R. Brenner, 1998, IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168).

The make-or-buy problem: a multidimensional perspective of foundry decisions

D. Meyersdorf, J. M. Padillo, D. Meyersdorf, 1996, IEEE/SEMI 1996 Advanced Semiconductor Manufacturing Conference and Workshop. Theme-Innovative Approaches to Growth in the Semiconductor Industry. ASMC 96 Proceedings.

Roadblocks to productivity improvement in the semiconductor industry

D. Meyersdorf, M. Bayyigit, 1997, Innovation in Technology Management. The Key to Global Leadership. PICMET '97.

Incorporating manufacturing objectives into the semiconductor facility layout design process: A methodology and selected cases

D. Meyersdorf, J. M. Padillo, O. Reshef, 1997, 1997 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop ASMC 97 Proceedings.

Improving wafer fab productivity with efficient floor layouts

D. Meyersdorf, J. M. Padillo, 1998 .