Robert Ecoffet

L. Guibert, E. Vergnault, Robert Ecoffet, 2000, 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527).

Determination of key parameters for SEU occurrence using 3-D full cell SRAM simulations

Robert Ecoffet, J. Gasiot, C. Tavernier, 1999 .

THESIC: A testbed suitable for the qualification of integrated circuits devoted to operate in harsh environment

Raoul Velazco, Robert Ecoffet, P. Cheynet, 1998 .

Radiation tolerance of a fuzzy controller

Raoul Velazco, Robert Ecoffet, P. Cheynet, 1998 .

Heavy ion test results on memories

Robert Ecoffet, S. Duzellier, D. Falguere, 1992, Workshop Record 1992 IEEE Radiation Effects Data Workshop.

Digital fuzzy control: a robust alternative suitable for space application

Raoul Velazco, Robert Ecoffet, P. Cheynet, 1998 .

Evaluation on Protective Single Event Burnout Test Method for Power DMOSFETs

Robert Ecoffet, Michele Muschitiello, Francoise Bezerra, 2012, IEEE Transactions on Nuclear Science.

Memories response toMBU and Semi-empirical approach forSEErate calculation

Robert Ecoffet, S. Duzellier, T. Nuns, 2005 .

Compendium of Recent SEE, and TID Test Results conducted by CNES from 2011-2016

Robert Ecoffet, Florence Malou, Roberta Pilia, 2017, 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

CARMEN2/MEX: An in-flight laboratory for the observation of radiation effects on electronic devices

Robert Ecoffet, Francoise Bezerra, Eric Lorfevre, 2011, 2011 12th European Conference on Radiation and Its Effects on Components and Systems.

New Methodology for Simulation of Soft Errors in Digital Processors

S. Rezgui, Santiago Rodriguez, Raoul Velazco, 2002 .

Pulsed laser validation of recovery mechanisms of critical SEE's in an artificial neural network system

S. P. Buchner, Raoul Velazco, Robert Ecoffet, 1997 .

Cosmic rayabundance inspace vehicles according to their LETandrange.

Robert Ecoffet, Eric Lorfevre, Frangoise Bezerra, 2005 .

Heavy ion component test coordination

Robert Ecoffet, S. Duzellier, M. Romero, 1991, RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems.

EXEQ I-IV: SEE in-flight measurement on the MIR orbital station

Robert Ecoffet, S. Duzellier, D. Falguere, 2000, 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527).

SEU fault tolerance in artificial neural networks

Raoul Velazco, A. Assoum, Robert Ecoffet, 1995 .

EXEQ II and III: On-board experiments for the study of single events

Robert Ecoffet, S. Duzellier, D. Falguere, 1997, RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294).

Radiation effects on image sensors

A. Bardoux, Robert Ecoffet, Olivier Gilard, 2017, International Conference on Space Optics.

SEE in-flight data for two static 32KB memories on high earth orbit

Raoul Velazco, Robert Ecoffet, B. Nicolescu, 2002, IEEE Radiation Effects Data Workshop.

FASTRAD 3.2: Radiation Shielding Tool with a New Monte Carlo Module

Robert Ecoffet, Guy Rolland, Jean-Charles Thomas, 2010, 2011 IEEE Radiation Effects Data Workshop.

SEU induced errors observed in microprocessor systems

Craig Underwood, Raoul Velazco, Robert Ecoffet, 1998 .

Two CMOS memory cells suitable for the design of SEU-tolerant VLSI circuits

Raoul Velazco, Robert Ecoffet, S. Duzellier, 1994 .

Evidences of SEU tolerance for digital implementations of artificial neural networks: one year MPTB flight results

Raoul Velazco, Robert Ecoffet, P. Cheynet, 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).

One year SEU flight results for two 32KB commercial SRAMs on-board a scientific satellite

Raoul Velazco, Robert Ecoffet, P. Cheynet, 1999 .

Classical vs. neural approaches for on-board image satellite analysis

Raoul Velazco, Robert Ecoffet, P. Cheynet, 1997 .

Proton-Induced Single-Event Degradation in SDRAMs

Luigi Dilillo, Robert Ecoffet, Frederic Wrobel, 2016, IEEE Transactions on Nuclear Science.

Heavy ion induced single hard errors on submicronic memories (for space application)

Robert Ecoffet, P. Garnier, T. Carriere, 1992 .

Robustness against S.E.U. of an artificial neural network space application

Raoul Velazco, A. Assoum, Robert Ecoffet, 1995 .

In-flight Anomalies on Electronic Devices

Robert Ecoffet, R. Ecoffet, 2007 .

Radiation environment measurements with SPICA on-board the MIR station

Robert Ecoffet, S. Duzellier, T. Nuns, 2002 .

SEU response of an entire SRAM cell simulated as one contiguous three dimensional device domain

Robert Ecoffet, J. Gasiot, G. Bruguier, 1998 .

In-flight observations of the radiation environment and its effects on devices in the SAC-C polar orbit

Robert Ecoffet, S. Duzellier, T. Nuns, 2002 .

OMERE - A Toolkit for Space Environment

Sebastien Bourdarie, Robert Ecoffet, Philippe Calvel, 2004 .

The latchup risk of CMOS-technology in space

Robert Ecoffet, J. Gasiot, G. Bruguier, 1993 .

Using a carbon beam as a probe to extract the thickness of sensitive volumes

Robert Ecoffet, S. Duzellier, C. Inguimbert, 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).

Using a carbon beam as a probe to extract the thickness of sensitive volumes

Robert Ecoffet, Sophie Duzellier, C. Inguimbert, 1999 .

An integrated sensor using optically stimulated luminescence for in-flight dosimetry

Robert Ecoffet, J. Gasiot, Laurent Dusseau, 2000 .

Characterization of an integrated sensor using optically stimulated luminescence for in-flight dosimetry

Robert Ecoffet, J. Gasiot, Laurent Dusseau, 2002 .

Low LET cross-section measurements using high energy carbon beam [DRAMs/SRAMs]

Robert Ecoffet, S. Duzellier, D. Falguere, 1997 .

Protons and heavy ions induced stuck bits on large capacity RAMs

Robert Ecoffet, S. Duzellier, D. Falguere, 1993, RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3).

An empirical model for predicting proton induced upset

Robert Ecoffet, S. Duzellier, D. Falguere, 1996 .

Space radiation evaluation of 16 Mbit DRAMs for mass memory applications

E. G. Stassinopoulos, Robert Ecoffet, S. Duzellier, 1994 .

Experimental determination of the frequency factor of thermal annealing processes in metal–oxide–semiconductor gate-oxide structures

Kenneth F. Galloway, Ronald D. Schrimpf, Robert Ecoffet, 1997 .

Cell design modifications to harden an N-channel power IGBT against single event latchup

Robert Ecoffet, J. Gasiot, Eric Lorfevre, 1999 .

Contribution of GEANT4 to the determination of sensitive volumes in case of high-integrated RAMs

Robert Ecoffet, S. Duzellier, C. Inguimbert, 2002 .

SEE results using high energy ions

Robert Ecoffet, S. Duzellier, D. Falguere, 1995 .

Prediction of the one-year thermal annealing of irradiated commercial devices based on experimental isochronal curves

F. Saigne, Ronald D. Schrimpf, Robert Ecoffet, 2000 .

Heavy ion induced failures in a power IGBT

Robert Ecoffet, J. Gasiot, J.-M. Palau, 1997 .

Experimental procedure to predict the competition between the degradation induced by irradiation and thermal annealing of oxide trapped charge in MOSFETs

F. Saigne, Ronald D. Schrimpf, Robert Ecoffet, 2000 .

Analysis of the proton-induced permanent degradation in an optocoupler

Robert Ecoffet, J. Gasiot, Laurent Dusseau, 2002 .

Observation of heavy ion induced transients in linear circuits

Robert Ecoffet, S. Duzellier, P. Tastet, 1994, Workshop Record. 1994 IEEE Radiation Effects Data Workshop.

Operational Impact of Statistical Properties of Single Event Phenomena for On-Orbit Measurements and Predictions Improvement

Guillaume Hubert, Robert Ecoffet, R. Ecoffet, 2013, IEEE Transactions on Nuclear Science.

Application of laser testing in study of SEE mechanisms in 16-Mbit DRAMs

V. Pouget, Robert Ecoffet, S. Duzellier, 2000 .

Hardening of a radiation sensor based on optically stimulated luminescence

Robert Ecoffet, Laurent Dusseau, S. Ducret, 2003 .

Influence of solar cycle on SPOT-1,-2,-3 upset rates

Robert Ecoffet, S. Duzellier, D. Falguere, 1995 .

The CESR multi-mission radiation monitor

Robert Ecoffet, G. Rouaix, P. Calvel, 1995 .

Comparison between ground tests and flight data for two static 32 KB memories

Robert Ecoffet, P. Cheynet, S. Duzellier, 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).