P. Rutter

发表

A methodology for projecting SiO2 thick gate oxide reliability on trench power MOSFETs and its application on MOSFETs VGS rating

E. Efthymiou, P. Rutter, P. Whiteley, 2016, Microelectron. Reliab..

Understanding Linear-Mode Robustness in Low-Voltage Trench Power MOSFETs

P. Rutter, O. Alatise, I. Kennedy, 2010, IEEE Transactions on Device and Materials Reliability.