Aldo Armigliato

发表

Stress Engineering in Si Based Micro Structures Using Technology Computer-Aided Design( the IEEE International Conference on SISPAD '02)

Ingrid De Wolf, Vincent Senez, Herve Jaouen, 2003 .

Round robin investigation of silicon oxide on silicon reference materials for ellipsometry

J. Van Landuyt, Herman Maes, J. C. G. de Sande, 1993 .

Boron and antimony codiffusion in silicon

B. Margesin, Sandro Solmi, Aldo Armigliato, 1991 .

Precipitation as the phenomenon responsible for the electrically inactive phosphorus in silicon

D. Nobili, Sandro Solmi, Aldo Armigliato, 1982 .

Strain Determination in Silicon Microstructures by Combined TEM/CBED, Process Simulation and micro-Raman Spectroscopy

I. De Wolf, Vincent Senez, Roberto Balboni, 2003 .

Strain determination in silicon microstructures by combined convergent beam electron diffraction, process simulation, and micro-Raman spectroscopy

Ingrid De Wolf, Vincent Senez, G. Carnevale, 2003 .

Modern Developments and Applications in Microbeam Analysis

Aldo Armigliato, A. Armigliato, W. Nicholson, 1998 .

Electrical activity and structural evolution correlations in laser and thermally annealed As‐implanted Si specimens

Sandro Solmi, M. Servidori, Aldo Armigliato, 1990 .