Barry C. Muddle

In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale

Osami Sakata, Andrei Y. Nikulin, Alexei Y. Souvorov, 2008, Optical Engineering + Applications.

Toward in situ x-ray diffraction imaging at the nanometer scale

Osami Sakata, Andrei Y. Nikulin, Nadia A. Zatsepin, 2008, NanoScience + Engineering.

Three-dimensional x-ray diffraction nanoscopy

Andrei Y. Nikulin, Nadia A. Zatsepin, Ruben A. Dilanian, 2008, NanoScience + Engineering.

Influence of Solution Treatment on Microstructure and Quench Cracking in a Water-Quenched Aluminium Alloy 7150

Barry C. Muddle, Hua Chen, P. Rometsch, 2010 .

Estimation of the Reconstruction Parameters for Atom Probe Tomography

Baptiste Gault, Simon P. Ringer, Leigh T. Stephenson, 2008, Microscopy and Microanalysis.