K. Okuyama
发表
Y. Ohji,
Shiro Kamohara,
M. Kawakami,
2001,
2001 6th International Workshop on Statistical Methodology (Cat. No.01TH8550).
D. Hisamoto,
K. Toba,
Y. Shimamoto,
2007,
2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop.
H. Katto,
K. Okuyama,
T. Agatsuma,
1989,
Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference.
E. Murakami,
Y. Ooji,
K. Kubota,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
K. Kubota,
K. Okuyama,
K. Kubota,
1998,
Proceedings Electrical Overstress/Electrostatic Discharge Symposium.
S. Ikeda,
H. Katto,
K. Okuyama,
1984,
1984 International Electron Devices Meeting.
K. Kubota,
K. Okuyama,
S. Yoshida,
1994,
Proceedings of 1994 VLSI Technology Symposium.
T. Mine,
H. Kume,
T. Tanaka,
2004,
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..