R.D. Schrimpf
发表
B. Narasimham,
A.F. Witulski,
W.T. Holman,
2008,
IEEE Transactions on Device and Materials Reliability.
R.D. Schrimpf,
R.M. Warner,
1987,
IEEE Transactions on Electron Devices.
J.D. Cressler,
B. Sierawski,
R.A. Reed,
2006,
IEEE Transactions on Nuclear Science.
C. Carmichael,
R.A. Reed,
L.W. Massengill,
2007,
IEEE Transactions on Nuclear Science.
Quantifying the Effectiveness of Guard Bands in Reducing the Collected Charge Leading to Soft Errors
B. Narasimham,
A.F. Witulski,
W.T. Holman,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
R.A. Reed,
L.W. Massengill,
R.D. Schrimpf,
2007,
2007 IEEE International Conference on Integrated Circuit Design and Technology.
B. Narasimham,
W. T. Holman,
R.A. Reed,
2009,
IEEE Transactions on Device and Materials Reliability.
R.A. Reed,
R.D. Schrimpf,
P.R. Fleming,
2008,
IEEE Transactions on Device and Materials Reliability.
B.L. Bhuva,
A.F. Witulski,
L.W. Massengill,
2006,
IEEE Transactions on Nuclear Science.
R.D. Schrimpf,
C. Chatry,
P.C. Adell,
2005,
IEEE Transactions on Nuclear Science.
V. Ramachandran,
B.L. Bhuva,
R.D. Schrimpf,
2006,
IEEE Transactions on Nuclear Science.
R.A. Reed,
L.W. Massengill,
R.D. Schrimpf,
2007,
IEEE Transactions on Nuclear Science.
R.D. Schrimpf,
M.J. Gadlage,
P.H. Eaton,
2004,
IEEE Transactions on Nuclear Science.