S. Watabe

A Simple Test Structure for Evaluating the Variability in Key Characteristics of a Large Number of MOSFETs

A. Teramoto, S. Sugawa, S. Watabe, 2012, IEEE Transactions on Semiconductor Manufacturing.

Random Telegraph Signal Statistical Analysis using a Very Large-scale Array TEG with 1M MOSFETs

S. Sugawa, S. Watabe, K. Abe, 2007, 2007 IEEE Symposium on VLSI Technology.

A Test Structure for Statistical Evaluation of Characteristics Variability in a Very Large Number of MOSFETs

A. Teramoto, S. Watabe, N. Miyamoto, 2009, 2009 IEEE International Conference on Microelectronic Test Structures.

Accurate Time Constant of Random Telegraph Signal Extracted by a Sufficient Long Time Measurement in Very Large-Scale Array TEG

A. Teramoto, S. Watabe, N. Miyamoto, 2009, 2009 IEEE International Conference on Microelectronic Test Structures.

Characterization of MOSFETs intrinsic performance using in-wafer advanced Kelvin-contact device structure for high performance CMOS LSIs

S. Sugawa, S. Watabe, T. Komuro, 2008, 2008 IEEE International Conference on Microelectronic Test Structures.

A Test Circuit for Statistical Evaluation of $p-n$ Junction Leakage Current and its Noise

R. Kuroda, S. Watabe, S. Sugawa, 2012, IEEE Transactions on Semiconductor Manufacturing.

New Statistical Evaluation Method for the Variation of Metal–Oxide–Semiconductor Field-Effect Transistors

Tadahiro Ohmi, Shigetoshi Sugawa, S. Watabe, 2007 .