Y. Bilenko
发表
J. Yang,
Gaudenzio Meneghesso,
Enrico Zanoni,
2010,
Microelectron. Reliab..
R. Gaska,
A. Lunev,
M.A. Khan,
2005,
2005 International Semiconductor Device Research Symposium.
R. Gaska,
G. Meneghesso,
M. Meneghini,
2008,
2008 IEEE International Reliability Physics Symposium.
R. Gaska,
M. Shur,
A. Lunev,
2012,
70th Device Research Conference.