M. Shatalov

发表

J. Yang, Gaudenzio Meneghesso, Enrico Zanoni, 2010, Microelectron. Reliab..

R. Gaska, G. Meneghesso, M. Meneghini, 2008, 2008 IEEE International Reliability Physics Symposium.

G. Simin, A. Koudymov, M. Asif Khan, 2002, IEEE Electron Device Letters.

R. Gaska, M. Shur, A. Lunev, 2012, 70th Device Research Conference.

J. Yang, M. Asif Khan, M. Shatalov, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..