Mohamed Abbas
发表
Noureddine Said,
Mohamed Abbas,
B. Boumeddane,
2010
.
Hoda A. ElMaraghy,
Mohamed Abbas,
H. Elmaraghy,
2016
.
Hoda A. ElMaraghy,
Mohamed Abbas,
H. Elmaraghy,
2016
.
Kwang-Ting Cheng,
Kunihiro Asada,
Satoshi Komatsu,
2009,
2009 14th IEEE European Test Symposium.
Hoda A. ElMaraghy,
Mohamed Abbas,
H. Elmaraghy,
2018
.
Kunihiro Asada,
Makoto Ikeda,
Mohamed Abbas,
2005
.
Kunihiro Asada,
Takahiro J. Yamaguchi,
Takafumi Aoki,
2011,
2011 IEEE International Symposium of Circuits and Systems (ISCAS).
Kwang-Ting Cheng,
Kunihiro Asada,
Satoshi Komatsu,
2010,
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010).
Makoto Ikeda,
Kunihiro Asada,
Mohamed Abbas,
2006,
2006 IEEE Design and Diagnostics of Electronic Circuits and systems.
Kunihiro Asada,
Takahiro J. Yamaguchi,
Kiichi Niitsu,
2012,
2012 IEEE 21st Asian Test Symposium.
Mohamed Abbas,
2011,
2011 IEEE 6th International Design and Test Workshop (IDT).
Mohamed Abbas,
2012
.
Mohamed Abbas,
Ashraf Ramadan,
M. Abbas,
2018,
Integr..
Kunihiro Asada,
Satoshi Komatsu,
Mohamed Abbas,
2010,
2010 IEEE Asian Solid-State Circuits Conference.
Makoto Ikeda,
Kunihiro Asada,
Mohamed Abbas,
2005,
2005 12th IEEE International Conference on Electronics, Circuits and Systems.
Kunihiro Asada,
Satoshi Komatsu,
Mohamed Abbas,
2009,
2009 IEEE 8th International Conference on ASIC.
Mohamed Abbas,
Mohamed Atef,
Ahmed Atef,
2016,
2016 IEEE International Symposium on Circuits and Systems (ISCAS).
Noise effects on performance of low power design schemes in deep submicron regime [CMOS digital ICs]
Kunihiro Asada,
Makoto Ikeda,
Mohamed Abbas,
2004
.
Makoto Ikeda,
Kunihiro Asada,
Mohamed Abbas,
2006,
IEICE Trans. Electron..
Makoto Ikeda,
Kunihiro Asada,
Mohamed Abbas,
2006,
IEICE Trans. Electron..
Kasem Khalil,
Mohamed Abbas,
Mohamed Abdelgawad,
2013,
2013 8th IEEE Design and Test Symposium.
Noise effects on performance of low power design schemes in deep submicron regime [CMOS digital ICs]
Makoto Ikeda,
Kunihiro Asada,
Mohamed Abbas,
2004,
19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings..
Noureddine Said,
Mohamed Abbas,
B. Boumeddane,
2008
.
Kunihiro Asada,
Takahiro J. Yamaguchi,
Satoshi Komatsu,
2011,
2011 18th IEEE International Conference on Electronics, Circuits, and Systems.
Makoto Ikeda,
Kunihiro Asada,
Mohamed Abbas,
2006,
Proceedings of the Design Automation & Test in Europe Conference.
Mohamed Abbas,
Mohamed Atef,
Ehab A. Hamed,
2018,
2018 25th International Conference "Mixed Design of Integrated Circuits and System" (MIXDES).
Mohamed Abbas,
Nahla T. Abou-El-Kheir,
Mohamed Essam Khedr,
2014,
2014 9th International Symposium on Communication Systems, Networks & Digital Sign (CSNDSP).
Kunihiro Asada,
Takahiro J. Yamaguchi,
Satoshi Komatsu,
2014,
IEICE Trans. Fundam. Electron. Commun. Comput. Sci..
Kunihiro Asada,
Takahiro J. Yamaguchi,
Takafumi Aoki,
2011,
2011 IEEE International Test Conference.
Guoxing Wang,
Mohamed Abbas,
Elsayed Esam M. Khaled,
2019,
Microelectron. J..
Hoda A. ElMaraghy,
Mohamed Abbas,
H. Elmaraghy,
2015
.
Mohamed Abbas,
Nawaf ALjehani,
2021,
2021 28th International Conference on Mixed Design of Integrated Circuits and System.
Mohamed Atef,
Mohamed Abbas,
Elsayed Esam M. Khaled,
2016,
2016 Fourth International Japan-Egypt Conference on Electronics, Communications and Computers (JEC-ECC).