Hosam Haggag

发表

A new erase VT distribution model for reliability design in high density flash EEPROM

Min-Hwa Chi, Albert Bergemont, Hosam Haggag, 1995, 1995 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers.

Test time reduction of successive approximation register A/D converter by selective code measurement

Abhijit Chatterjee, Shalabh Goyal, Hosam Haggag, 2005, IEEE International Conference on Test, 2005..

A 65ns 1Mb CMOS alternate metal virtual ground EPROM with dual reference sensing scheme and word line voltage regulator

Hosam Haggag, L. Hoang, P. Nielsen, 1993, 1993 International Symposium on VLSI Technology, Systems, and Applications Proceedings of Technical Papers.

Experimental results for high-speed jitter measurement technique

Mani Soma, Hosam Haggag, K. Taylor, 2004 .

Special issue on BIT CMOS built-in test architecture for high-speed jitter measurement

Bryan Nelson, Mani Soma, Hosam Haggag, 2005, IEEE Transactions on Instrumentation and Measurement.

Robot Interaction Using Cricket, an Indoor Positioning System

Hosam Haggag, 2006 .

Panel synopsis: reducing high-speed/RF test cost: guaranteed by design or guaranteed to fail?

Abhijit Chatterjee, Hosam Haggag, 2005, IEEE International Conference on Test, 2005..

Closing The Gap Between Process Development and Mixed Signal Design and Testing

Hosam Haggag, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

Experimental results for high-speed jitter measurement technique

Bryan Nelson, Mani Soma, Hieu Nguyen, 2004, 2004 International Conferce on Test.

NOR virtual ground (NVG)-a new scaling concept for very high density flash EEPROM and its implementation in a 0.5 um process

Hosam Haggag, Albert Bergemont, Graham R. Wolstenholme, 1993, Proceedings of IEEE International Electron Devices Meeting.

Testing of Precision DACs Using Low-Resolution ADCs with Dithering

Degang Chen, Randall L. Geiger, Le Jin, 2006, 2006 IEEE International Test Conference.

M: A New High Perfo nology for Porta a munications Applicati

Min-Hwa Chi, Albert Bergemont, Hosam Haggag, 1996 .

Testing of Precision DAC Using Low-Resolution ADC With Wobbling

Degang Chen, Randall L. Geiger, Le Jin, 2008, IEEE Transactions on Instrumentation and Measurement.

Automated test development and test time reduction for RF subsystems

Sule Ozev, Alex Orailoglu, Hosam Haggag, 2002, 2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353).

A new cell and process for very high density full feature EEPROMs and low power applications

Hosam Haggag, Albert Bergemont, M. Hart, 1993, 1993 International Symposium on VLSI Technology, Systems, and Applications Proceedings of Technical Papers.

Low Voltage NVGTM: A New High Performance 3V/5V Flash Technology for Portable Computing and Telecommunications Applications

Albert Bergemont, Hosam Haggag, Min Haw Chi, 1995, ESSDERC '95: Proceedings of the 25th European Solid State Device Research Conference.

A New Very High Density Full Feature EEPROM Cell with minimum Process Complexity

Albert Bergemont, Hosam Haggag, Mike Hart, 1993, ESSDERC '93: 23rd European solid State Device Research Conference.

Cmos built-in test architecture for high-speed jitter measurement

Mani Soma, Hosam Haggag, Alan Chong, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Decision tree based mismatch diagnosis in analog circuits

Mingjing Chen, Alex Orailoglu, Hosam Haggag, 2006, 24th IEEE VLSI Test Symposium.

Alternate metal virtual ground EPROM array implemented in a 0.8 mu m process for very high density applications

Hosam Haggag, Albert Bergemont, A. Kablanian, 1991, International Electron Devices Meeting 1991 [Technical Digest].