S. Pommier

A study of the effect of degradation of the aluminium metallization layer in the case of power semiconductor devices

Stéphane Lefebvre, S. Bontemps, S. Pietranico, 2011, Microelectron. Reliab..

Characterisation of power modules ceramic substrates for reliability aspects

Stéphane Lefebvre, Zoubir Khatir, S. Bontemps, 2009, Microelectron. Reliab..

Thermal Fatigue of a Railway Wheel

F. Demilly, S. Pommier, B. Al Taweel, 2005 .