E. Sparrer

Deconvolution of atomic force measurements in special modes - methodology and application

E. Sparrer, T. Machleidt, Rico Nestler, 2007 .

Kelvin probe force microscopy: measurement data reconstruction

Tim Kubertschak, E. Sparrer, T. Machleidt, 2009, Scanning Microscopies.

Integration of CMM software standards for nanopositioning and nanomeasuring machines

Tino Hausotte, Eberhard Manske, E. Sparrer, 2011, Defense + Commercial Sensing.

Navigation in a Large Measurement Volume by Using AFM Technology as a Sensor System in the NPMMNavigation in einem großen Messvolumen in der Nanopositionier- und Mess-Maschine (NPMM) mittels AFM-Technologie

Eberhard Manske, E. Sparrer, T. Machleidt, 2009 .

A framework for using optical sensors in nanomeasuring machines over I++/DME

Tino Hausotte, Eberhard Manske, E. Sparrer, 2012 .

Measurement, visualization and analysis of extremely large data sets with a nanopositioning and nanomeasuring machine

E. Manske, E. Sparrer, T. Machleidt, 2013, Optical Metrology.

Area-based optical 2.5D sensors of a nanopositioning and nanomeasuring machine

Eberhard Manske, E. Sparrer, T. Machleidt, 2012 .

Freiheitsgradregularisierte Entfaltung von Messdaten aus AFM-Sondermodi DoF-Restricted Deconvolution of Measured Data from AFM Special Modes

E. Sparrer, Rico Nestler, Karl-Heinz Franke, 2008 .