E. Rosenbaum
发表
Kuo-Hsuan Meng,
E. Rosenbaum,
2012,
Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012.
E. Rosenbaum,
A. Gerdemann,
K. Bhatia,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
E. Rosenbaum,
F. Farbiz,
2011,
IEEE Transactions on Device and Materials Reliability.
E. Rosenbaum,
F. Farbiz,
E. Rosenbaum,
2011,
IEEE Transactions on Device and Materials Reliability.
E. Rosenbaum,
R. Mertens,
H. Kunz,
2012,
Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012.
E. Rosenbaum,
R. Mertens,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
K. Chatty,
E. Rosenbaum,
J. Di Sarro,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
E. Rosenbaum,
R. Kanj,
T. Lehner,
2002,
2002 IEEE International SOI Conference.
E. Rosenbaum,
S. Hyvonen,
2005,
2005 Electrical Overstress/Electrostatic Discharge Symposium.
E. Rosenbaum,
N. Jack,
2013,
IEEE Transactions on Device and Materials Reliability.
V.A. Vashchenko,
V. Kuznetsov,
E. Rosenbaum,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
Kuo-Hsuan Meng,
E. Rosenbaum,
2013,
IEEE Transactions on Device and Materials Reliability.
E. Rosenbaum,
C.-H. Tsai,
T. Li,
1998,
Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347).
E. Rosenbaum,
K. Bhatia,
S. Hyvonen,
2007,
IEEE Journal of Solid-State Circuits.
E. Rosenbaum,
F. Farbiz,
2008,
2008 IEEE International Electron Devices Meeting.
E. Rosenbaum,
N. Jack,
V. Shukla,
2011,
IEEE Transactions on Device and Materials Reliability.
E. Rosenbaum,
A. Gerdemann,
M. Stockinger,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
R. Gauthier,
E. Rosenbaum,
Junjun Li,
2004,
2004 Electrical Overstress/Electrostatic Discharge Symposium.
E. Rosenbaum,
A. Kripanidhi,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
Sung-Mo Kang,
E. Rosenbaum,
S. Ramaswamy,
1995,
Electrical Overstress/Electrostatic Discharge Symposium Proceedings.
E. Rosenbaum,
S. Joshi,
E. Rosenbaum,
2003,
2003 Electrical Overstress/Electrostatic Discharge Symposium.
E. Rosenbaum,
N. Jack,
2012,
Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012.
E. Rosenbaum,
J. Di Sarro,
2008,
2008 IEEE International Reliability Physics Symposium.
E. Rosenbaum,
F. Farbiz,
2008,
2008 IEEE International Reliability Physics Symposium.
E. Rosenbaum,
N. Jack,
N. Thomson,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
E. Rosenbaum,
V. Vashchenko,
P. Hopper,
2008,
EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.
E. Rosenbaum,
S. Hyvonen,
S. Joshi,
2003,
2003 Electrical Overstress/Electrostatic Discharge Symposium.
E. Rosenbaum,
R. Kanj,
E. Rosenbaum,
2002,
2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353).
E. Rosenbaum,
S. Hyvonen,
S. Joshi,
2005,
IEEE Transactions on Electron Devices.
E. Rosenbaum,
S. Hyvonen,
Junjun Li,
2004,
2004 Electrical Overstress/Electrostatic Discharge Symposium.
E. Rosenbaum,
S. Chetlur,
E. Rosenbaum,
2000,
IEEE Electron Device Letters.
E. Rosenbaum,
F. Farbiz,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
E. Rosenbaum,
P. Raha,
J.W. Miller,
1997,
IEEE Electron Device Letters.
Sung-Mo Kang,
Chin-Chi Teng,
E. Rosenbaum,
1996,
33rd Design Automation Conference Proceedings, 1996.
E. Rosenbaum,
P. Hopper,
V. Vashchenko,
2008,
EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.
E. Rosenbaum,
Wen-Yi Chen,
M. Ker,
2012,
IEEE Transactions on Device and Materials Reliability.
E. Rosenbaum,
C. Hu,
E. Rosenbaum,
1991,
IEEE Electron Device Letters.
Chenming Calvin Hu,
E. Rosenbaum,
R. Moazzami,
1991,
1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers.
E. Rosenbaum,
E. Rosenbaum,
J. Wu,
2004,
IEEE Transactions on Electron Devices.
E. Rosenbaum,
C. Hu,
E. Rosenbaum,
1991,
IEEE Electron Device Letters.
E. Rosenbaum,
E. Rosenbaum,
J. Lee,
2008,
EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.
E. Rosenbaum,
R. Barnes,
Hongmei Li,
2005,
IEEE Transactions on Electron Devices.
E. Rosenbaum,
P. Raha,
J.W. Miller,
1997,
Proceedings Electrical Overstress/Electrostatic Discharge Symposium.
R. Gauthier,
K. Chatty,
E. Rosenbaum,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
Yu Wang,
P. Juliano,
E. Rosenbaum,
2000,
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476).
E. Rosenbaum,
E. Rosenbaum,
F. Farbiz,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
Sung-Mo Kang,
Chin-Chi Teng,
E. Rosenbaum,
1996,
33rd Design Automation Conference Proceedings, 1996.
E. Rosenbaum,
K. Bhatia,
S. Hyvonen,
2005,
2005 IEEE Radio Frequency integrated Circuits (RFIC) Symposium - Digest of Papers.