Kazumi Kurimoto

An electrothermal circuit simulation using an equivalent thermal network for electrostatic discharge (ESD)

Kyoji Yamashita, Atsushi Hori, Shinji Odanaka, 1994, Proceedings of 1994 VLSI Technology Symposium.

Anomalous TDDB Statistics of Gate Dielectrics Caused by Charging-Induced Dynamic Stress Relaxation Under Constant–Voltage Stress

Kenji Okada, Kazumi Kurimoto, Mitsuhiro Suzuki, 2016, IEEE Transactions on Electron Devices.

Impact of the reduction of the gate to drain capacitance on low voltage operated CMOS devices

Kyoji Yamashita, Shinji Odanaka, Hiroyuki Umimoto, 1995, 1995 Symposium on VLSI Technology. Digest of Technical Papers.