S.T. Liu

Angular effects in proton-induced single-event upsets in silicon-on-sapphire and silicon-on-insulator devices

R.A. Reed, H.S. Kim, P.W. Marshall, 2004, 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774).

NBTI in SOI p-channel MOS field effect transistors

S.T. Liu, D.E. Ioannou, D.P. Ioannou, 2005, 2005 IEEE International Integrated Reliability Workshop.

Proton-induced upset in SOI CMOS SRAMS

S.T. Liu, H. Hughes, A. Campbell, 2004, IEEE Transactions on Nuclear Science.