P. Becker

Time and stress path dependant performance of excava- tions in soft soils

P. Becker, 2008 .

Ellipsometric measurements on single-crystal silicon spheres [for Avogadro's constant determination]

L. Koenders, H. Wolff, P. Becker, 1998, 1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254).

Combined optical and X–ray interferometry for high–precision dimensional metrology

J. Stümpel, A. Franks, M. Stedman, 2000, Proceedings of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences.

The skew-symmetric two-crystal X-ray interferometer

U. Bonse, P. Becker, U. Bonse, 1974 .

Neutron Interferometer with very thin Lamellae

Ulrich Bonse, M. Zawisky, P. Becker, 2001 .

Silicon lattice parameters as an absolute scale of length for high precision measurements of fundamental constants

P. Becker, D. Windisch, D. Windisch, 1990 .

Status of the na determination by counting atoms in silicon crystals

M. Borys, I. Busch, M. Krumrey, 2010, CPEM 2010.

The lattice parameter of highly pure silicon single crystals

H. Siegert, P. Becker, P. Becker, 1982 .

Present Status of the a Vogadro Constant Determination from Silicon Crystals with Natural Isotopic Composition

U. Kuetgens, A. Waseda, P. Becker, 2004, 2004 Conference on Precision Electromagnetic Measurements.