Zigui Cao

Investigation of charge trapping/de-trapping induced operation lifetime degradation in triple SuperFlash® memory cell

Bo Zhang, Xiong Zhang, Weiran Kong, 2008, Microelectron. Reliab..

An effective approach to improve split-gate flash product data retention

Zigui Cao, Zhilin Tang, Dailong Wei, 2017 .

A Model With Temperature-Dependent Exponent for Hot-Carrier Injection in High-Voltage nMOSFETs Involving Hot-Hole Injection and Dispersion

Mingzhi Dai, Kinleong Yap, Zigui Cao, 2008, IEEE Transactions on Electron Devices.