Kapil Rathi

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Analysis of the Effect of Temperature and Vdd on Leakage Current in Conventional 6TSRAM BitCell at 90nm and 65nm Technology

Manisha Pattanaik, Shilpi Birla, Rohtas Singh, 2011 .

Analysis of 8T SRAM Cell at Various Process Corners at 65 nm Process Technology

Manisha Pattanaik, Shilpi Birla, Rakesh Kumar Singh, 2011, Circuits Syst..