Canan Baristiran Kaynak

Group IV Heteroepitaxy for Advanced Electronic Devices Integrated in BiCMOS Technology

Stefan Lischke, Bernd Heinemann, Mehmet Kaynak, 2019 .

A Test Platform for the Noise Characterization of SiGe Microbolometer ROICs

Mehmet Kaynak, Yasar Gurbuz, Atia Shafique, 2018, IEEE Sensors Journal.