J. P. Sorbier

Extraction of Fowler-Nordheim parameters of thin SiO/sub 2/ oxide film including polysilicon gate depletion: validation with an EEPROM memory cell

Rachid Bouchakour, Pierre Canet, Nadia Harabech, 2000, 2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings (IEEE Cat No.00CH36353).

Structure and single‐crystal conductivity measurements of oxidized 3d metal phthalocyanines. Bis‐chloro derivatives of chromium(III), iron(III) and cobalt(III)

J. P. Sorbier, M. Ley, B. Moubaraki, 1990 .