Tae Bong Eom

发表

Device for calibration of the height micrometers and the squareness standards

Tae Bong Eom, 2003, SPIE Optics + Photonics.

Calibration of two-dimensional nanometer gratings using optical diffractometer and metrological atomic force microscope

Byong Chon Park, Jae Wan Kim, Tae Bong Eom, 2005, SPIE Optics + Photonics.

Novel interferometer for three-dimensional coordinate measurement of freely moving objects

Jae Wan Kim, Tae Bong Eom, Chu-Shik Kang, 2003, SPIE Optical Metrology.

Development of a precision dual level stage system for the dimensional metrology of large range surface topography

Jae Wan Kim, Tae Bong Eom, Chu-Shik Kang, 2007, SPIE Optical Engineering + Applications.

An optical absolute position measurement method using a phase-encoded single track binary code.

Jae Wan Kim, Tae Bong Eom, Chu-Shik Kang, 2012, The Review of scientific instruments.

An optical straightness measurement sensor for the KRISS watt balance

Jae Wan Kim, Tae Bong Eom, Chu-Shik Kang, 2015 .

A novel Michelson interferometer combined with an autocollimator for the simultaneous measurement of linear and angular displacement

Jae Wan Kim, Tae Bong Eom, Chu-Shik Kang, 2005, SPIE Optics + Photonics.

Tape measuring system using linear encoder and digital camera

Jae Wan Kim, Tae Bong Eom, Jong Ahn Kim, 2013, Optical Metrology.

Calibration of angle artifacts and instruments using a high precision angle generator

Jae Wan Kim, Tae Bong Eom, Chu-Shik Kang, 2013 .

Calibration of integrating sphere system designed for roughness correction in optical calibration of gauge blocks

Jae Wan Kim, Tae Bong Eom, Chu-Shik Kang, 2007, SPIE Optical Engineering + Applications.

Determination of refractive index of transparent plate by Fabry-Perot fringe analysis

Hee Joo Choi, Myoungsik Cha, Jung Jin Ju, 2010, Optical Engineering + Applications.

Interferometric profile scanning system for measuring large planar mirror surface based on single-interferogram analysis using Fourier transform method

Tae Bong Eom, Chu-Shik Kang, Jong-Ahn Kim, 2018 .

Measurement of microscope calibration standards in nanometrology using a metrological atomic force microscope

Byong Chon Park, Tae Bong Eom, Jong-Ahn Kim, 2006 .

Absolute angle measurement using a phase-encoded binary graduated disk

Tae Bong Eom, Chu-Shik Kang, Jong-Ahn Kim, 2016 .

Metrological atomic force microscope using a large range scanning dual stage

Tae Bong Eom, Chu-Shik Kang, Jong-Ahn Kim, 2009 .

Note: high precision angle generator using multiple ultrasonic motors and a self-calibratable encoder.

Tae Bong Eom, Chu-Shik Kang, Jong-Ahn Kim, 2011, The Review of scientific instruments.

Thickness and refractive index measurement of a silicon wafer based on an optical comb.

Tae Bong Eom, Chu-Shik Kang, Jong-Ahn Kim, 2010, Optics express.

A digital signal processing module for real-time compensation of nonlinearity in a homodyne interferometer using a field-programmable gate array

Tae Bong Eom, Chu-Shik Kang, Jong-Ahn Kim, 2009 .

Precision angle comparator using self-calibration of scale errors based on the equal-division-averaged method

Tae Bong Eom, Chu-Shik Kang, Jong-Ahn Kim, 2013 .

An interferometric Abbe-type comparator for the calibration of internal and external diameter standards

Tae Bong Eom, Chu-Shik Kang, Jong-Ahn Kim, 2010 .