H.F.F. Jos

RF wireless integration

H.F.F. Jos, 2003, 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672).

A new extraction technique for the series resistances of semiconductor devices based on the intrinsic properties of bias-dependent y-parameters [bipolar transistor examples]

H.C. de Graaff, L.C.N. de Vreede, J.N. Burghartz, 2004, Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting.

Collector model describing bipolar transistor distortion at low voltages and high currents

H.F.F. Jos, H. Jos, 1994 .

Large signal verification of the circuit-oriented smoothie database model for LDMOS devices

L.C.N. de Vreede, J.N. Burghartz, H.F.F. Jos, 2004, 34th European Microwave Conference, 2004..