Yen-Yi Lin

Problems with IO to all other IOs ESD stress test: Two case studies

Yen-Yi Lin, S. Marum, C. Duvuury, 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium.

Characterizing devices using the IEC 61000-4-5 surge stress

Yen-Yi Lin, S. Marum, W. Kemper, 2012, Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012.

Capacitive coupled TLP (CC-TLP) and the correlation with the CDM

Charvaka Duvvury, Karlheinz Bock, Yen-Yi Lin, 2009, 2009 31st EOS/ESD Symposium.

Single pulse CDM testing and its relevance to IC reliability

C. Duvvury, P. Koeppen, Yen-Yi Lin, 2008, EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.

The challenges of on-chip protection for system level cable discharge events (CDE)

C. Duvvury, Yen-Yi Lin, S. Marum, 2008, EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.