Kyoung Hwan Yeo
发表
Dong-Won Kim,
Donggun Park,
Sungwoo Hwang,
2011
.
Donggun Park,
Byung-Il Ryu,
Eun Suk Cho,
2006
.
Sung Min Kim,
Chang Woo Oh,
Sung Hwan Kim,
2008,
2006 IEEE Nanotechnology Materials and Devices Conference.
Kyoung Hwan Yeo,
Dong-Won Kim,
S. Suk,
2006,
2009 Symposium on VLSI Technology.
Investigation on hot carrier reliability of Gate-All-Around Twin Si Nanowire Field Effect Transistor
Kyoung Hwan Yeo,
Dong-Won Kim,
G. Jin,
2009,
2009 IEEE International Reliability Physics Symposium.
Sung Min Kim,
Chang Woo Oh,
Sung Hwan Kim,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
Donggun Park,
Keun Hwi Cho,
Kyoung Hwan Yeo,
2007,
2007 IEEE Symposium on VLSI Technology.
Donggun Park,
Keun Hwi Cho,
Kyoung Hwan Yeo,
2007,
2007 IEEE International Electron Devices Meeting.
Donggun Park,
Jun Seo,
Keun Hwi Cho,
2008,
2008 Symposium on VLSI Technology.
Donggun Park,
Dong Won Kim,
Kyoung Hwan Yeo,
2008,
2008 Symposium on VLSI Technology.
Donggun Park,
Sung Woo Hwang,
Keun Hwi Cho,
2007,
IEEE Electron Device Letters.
Sung Min Kim,
Chang Woo Oh,
Sung Hwan Kim,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
Chang Woo Oh,
Sung Hwan Kim,
Donggun Park,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
Yoon-Ha Jeong,
Hyun-Sik Choi,
Chang-Ki Baek,
2011,
IEEE Transactions on Nanotechnology.
Hyungcheol Shin,
Donggun Park,
Kyoung Hwan Yeo,
2008,
2008 IEEE International Electron Devices Meeting.