Dorothee Hüser

发表

Dimensional Micro- and Nanometrology at PTB

Uwe Brand, Gaoliang Dai, Harald Bosse, 2011 .

Robust averaging of signals for triangulation sensors

Hendrik Rothe, Dorothee Hüser, 1998 .

Crossing-The-Line Segmentation as a Basis for Rsm and Rc Evaluation

Paul J. Scott, Dorothee Hüser, Matthias Eifler, 2020 .

Characterizing edge profiles of photomask structures with complementary information from SEM and AFM

Dorothee Hüser, Wolfgang Häßler-Grohne, 2013, Advanced Lithography.

RkRk material measure: A model based design

Dorothee Hüser, Matthias Eifler, Jörg Seewig, 2019 .

Intercomparison of scanning probe microscopes

Ludger Koenders, Dorothee Hüser, Wolfgang Kautek, 2002 .

Simple method to determine linearity deviations of topography measuring instruments with a large range axial scanning system

Dorothee Hüser, David Gerbert, Wilfried Bauer, 2020 .

Development of a 3D-AFM for true 3D measurements of nanostructures

Gaoliang Dai, Ludger Koenders, Hans-Ulrich Danzebrink, 2011 .

Current limitations of SEM and AFM metrology for the characterization of 3D nanostructures

Harald Bosse, C. G. Frase, Dorothee Hüser, 2011 .

Coordinate Measurements in Microsystems by Using AFM‐Probing: Problems and Solutions

Hendrik Rothe, Dorothee Hüser, Ralph Petersen, 2006 .

New developments at Physikalisch Technische Bundesanstalt in three-dimensional atomic force microscopy with tapping and torsion atomic force microscopy mode and vector approach probing strategy

Gaoliang Dai, Harald Bosse, Dorothee Hüser, 2012 .

Investigation of the cantilever response of non-contact atomic force microscopy for topography measurements in all three dimensions

Gaoliang Dai, Harald Bosse, Rainer Köning, 2011 .