Kevin Sanchez

发表

Frequency mapping in dynamic light emission with wavelet transform

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2013, Microelectron. Reliab..

Dynamic Laser Stimulation Case Studies

Romain Desplats, Philippe Perdu, Kevin Sanchez, 2005, Microelectron. Reliab..

Examining the Feasibility of a Method of Tripwire Detection Using Acoustics

Kevin Sanchez, W C Alberts, 2009 .

NIR laser stimulation for dynamic timing analysis

Romain Desplats, Philippe Perdu, Dean Lewis, 2005, Microelectron. Reliab..

Pattern image enhancement by automatic focus correction

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2017, Microelectron. Reliab..

Filtering and Emission Area Identification In the Time Resolved Imaging Data

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2012 .

Improvement of signal to noise ratio in electro optical probing technique by wavelets filtering

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2015, Microelectron. Reliab..

DAMSEL—Dynamic and Applicative Measurement of Single Events in Logic

Adrian Evans, Dan Alexandrescu, Kevin Sanchez, 2018, IEEE Transactions on Nuclear Science.

Single Event Transient acquisition and mapping for space device Characterization

Giovanna Mura, Kevin Sanchez, Guillaume Bascoul, 2016, Microelectron. Reliab..

ATE and lock-in thermography coupling techniques for a 3D defect localization in a 4-stacked die memory

Kevin Sanchez, Fulvio Infante, Nicolas Courjault, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).

A way to implement the electro-optical technique to inertial MEMS

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2015, Microelectron. Reliab..

Methodology to support laser-localized soft defects on analog and mixed-mode advanced ICs

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2009, 2009 IEEE International Reliability Physics Symposium.

Automatic process for time-frequency scan of VLSI

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2016, Microelectron. Reliab..

Identification of Process/Design Issues during 0.18μm Technology Qualification for Space Application

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2007, 2007 Design, Automation & Test in Europe Conference & Exhibition.

Solar Cell Analysis with Light Emission and OBIC Techniques

Romain Desplats, Philippe Perdu, Kevin Sanchez, 2003, Microelectron. Reliab..

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2008, Microelectron. Reliab..

New methodology for the assessment of the thermal resistance of laser diodes and light emitting diodes

Kevin Sanchez, Olivier Gilard, Frédéric Bourcier, 2010, Microelectron. Reliab..

A comprehensive study of the application of the EOP techniques on bipolar devices

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2014, Microelectron. Reliab..

Failure Localization and design debug on mixed-mode ICs by using the dynamic laser stimulation techniques

Philippe Perdu, Kevin Sanchez, Olivier Crepel, 2007 .

CADless laser assisted methodologies for failure analysis and device reliability

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2010, Microelectron. Reliab..

Unsupervised learning for signal mapping in dynamic photon emission

Chee Lip Gan, Stéphane Binczak, Philippe Perdu, 2015, Microelectron. Reliab..

Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2015, J. Electronic Imaging.

Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop

Chee Lip Gan, Philippe Perdu, Kevin Sanchez, 2016, Microelectron. Reliab..

Dynamic laser stimulation techniques for advanced failure analysis and design debug applications

Philippe Perdu, Kevin Sanchez, Felix Beaudoin, 2007, Microelectron. Reliab..

Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2017, 2017 20th International Conference on Information Fusion (Fusion).

Automatic localization of signal sources in photon emission images for integrated circuit analysis

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2018, Signal Image Video Process..

Dynamic Laser Stimulation Technique for device qualification process

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2008 .