D. Coolbaugh

The emerging role of SiGe BiCMOS technology in wired and wireless communications

Gregory G. Freeman, James S. Dunn, C. Dickey, 2002, Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611).

A manufacturable high-k MIM dielectric with outstanding reliability and voltage linearity for RF and mixed-signal technologies

J. Dunn, E. Eshun, K. Stein, 2004, Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004..

RF CMOS for microwave and mm-wave applications

B. Jagannathan, L. Wagner, D. Goren, 2006, Digest of Papers. 2006 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems.

High-density 3D electronic-photonic integration

V. Stojanovic, J. Hebding, S. Moazeni, 2015, 2015 Fourth Berkeley Symposium on Energy Efficient Electronic Systems (E3S).

Electrically Programmable Fuses for Analog and Mixed Signal Applications in Silicon Germanium BiCMOS Technologies

T. Kirihata, D. Coolbaugh, D. Coolbaugh, 2007, 2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting.

Reliability Characterization of BEOL Vertical Natural Capacitor using Copper and Low-k SiCOH Dielectric for 65nm RF and Mixed-Signal Applications

J. Gill, M. Shinosky, V. Ramachandran, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.

Advanced passive devices for enhanced integrated RF circuit performance

D. Harame, X. Wang, J. Johnson, 2002, 2002 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium. Digest of Papers (Cat. No.02CH37280).

The revolution in SiGe: Impact on device electronics

Alvin J. Joseph, James S. Dunn, David R. Greenberg, 2004 .

The influence of high resistivity substrates on CMOS latchup robustness

E. Gebreselasie, D. Coolbaugh, A. Joseph, 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium.

Current status and future trends of SiGe BiCMOS technology

Alvin J. Joseph, James S. Dunn, David L. Harame, 2001 .