Jae-Chul Om

Extractive method of threshold voltage distribution in floating gate NAND flash memory by using the charge pumping technique

Sung-Ho Bae, Jong-Ho Lee, Hyuck-In Kwon, 2008, 2008 IEEE Silicon Nanoelectronics Workshop.

Modeling of $V_{\rm th}$ Shift in nand Flash-Memory Cell Device Considering Crosstalk and Short-Channel Effects

Sang-Goo Jung, Jong-Ho Lee, Seung-Woo Shin, 2008, IEEE Transactions on Electron Devices.

The $\hbox{1}/f$ Noise and Random Telegraph Noise Characteristics in Floating-Gate nand Flash Memories

Hyuck-In Kwon, Jong-Ho Lee, Jung-Ryul Ahn, 2009, IEEE Transactions on Electron Devices.

Chip Level Reliability of MANOS Cells under Operating Conditions

Kyoung-Hwan Park, Jeong-Hyong Yi, Hyun-Seung Yoo, 2009, 2009 IEEE International Memory Workshop.

Modeling and Characterization of Program / Erasure Speed and Retention of TiN-gate MANOS (Si-Oxide-SiNx-Al2O3-Metal Gate) Cells for NAND Flash Memory

Kyoung-Hwan Park, Gi-Hyun Bae, Jung-Ryul Ahn, 2007, 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop.