Marcelino B. Santos

发表

Internet of Things and Artificial Intelligence - A Wining Partnership?

Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, 2020, Convergence of Artificial Intelligence and the Internet of Things.

RTL design validation, DFT and test pattern generation for high defects coverage

João Paulo Teixeira, Marcelino B. Santos, Fernando M. Gonçalves, 2001, IEEE European Test Workshop, 2001..

Ultra low power capless LDO with dynamic biasing of derivative feedback

Marcelino B. Santos, Jorge O. M. Esteves, João Pereira, 2013, Microelectron. J..

Level Shifters and DCVSL for a Low-Voltage CMOS 4.2-V Buck Converter

Marcelino B. Santos, José F. da Rocha, José M. Dores Costa, 2008, IEEE Transactions on Industrial Electronics.

Low-power frequency monitoring circuit for clock failure detection

Ricardo Chaves, Marcelino B. Santos, Rodrigo B. Capeleiro, 2018, 2018 Conference on Design of Circuits and Integrated Systems (DCIS).

Realistic fault analysis of CMOS analog building blocks

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1993, Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.

Defect-oriented Verilog fault simulation of SoC macros using a stratified fault sampling technique

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1999, Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).

Adjustable low consumption circuit for monitorization of power source voltages in a SoC

Marcelino B. Santos, Júlio Paisana, Floriberto A. Lima, 2008, APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems.

Physical DFT for High Coverage of Realistic Faults

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1992, Proceedings International Test Conference 1992.

Built-in aging monitoring for safety-critical applications

João Paulo Teixeira, Marcelino B. Santos, Ricardo Reis, 2009, 2009 15th IEEE International On-Line Testing Symposium.

Smart Control of Internal Supply Voltage Spikes in a Low Voltage DC-DC Buck Converter

Marcelino B. Santos, José F. da Rocha, José M. Dores Costa, 2011, J. Low Power Electron..

Statistically enhanced analogue and mixed-signal design and test

Marcelino B. Santos, Diogo R. Ferreira, Pedro L. Ramos, 2016, 2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW).

Digital modular control of high frequency DC-DC converters

Marcelino B. Santos, Floriberto A. Lima, Abilio Parreira, 2014, Microelectron. J..

Experiments on bridging fault analysis and layout-level DFT for CMOS designs

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1993, Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.

Controllability and observability in mixed signal cores

João Paulo Teixeira, Marcelino B. Santos, Nuno Dias, 2009, 2009 15th IEEE International On-Line Testing Symposium.

Predictive error detection by on-line aging monitoring

João Paulo Teixeira, Marcelino B. Santos, Ricardo Reis, 2010, 2010 IEEE 16th International On-Line Testing Symposium.

Built-In Self-Test Quality Assessment Using Hardware Fault Emulation In FPGAs

João Paulo Teixeira, Marcelino B. Santos, Abilio Parreira, 2004, Comput. Artif. Intell..

Low noise, high efficiency, segmented LCD drivers for ultra-low power applications in 22 nm FD-SOI

Marcelino B. Santos, Rodrigo B. Capeleiro, 2018, 2018 Conference on Design of Circuits and Integrated Systems (DCIS).

Monolithic Multi-mode DC-DC Converter with Gate Voltage Optimization

Marcelino B. Santos, Nuno Dias, Júlio Paisana, 2008, PATMOS.

Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2009, 2009 15th IEEE International On-Line Testing Symposium.

Test preparation methodology for high coverage of physical defects in CMOS digital ICs

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1995, Proceedings the European Design and Test Conference. ED&TC 1995.

Fault-tolerance in FPGA focusing power reduction or performance enhancement

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2015, 2015 16th Latin-American Test Symposium (LATS).

Dynamic fault test and diagnosis in digital systems using multiple clock schemes and multi-VDD test

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2005, 11th IEEE International On-Line Testing Symposium.

Analogue and Mixed-Signal Production Test Speed-Up by Means of Fault List Compression

Marcelino B. Santos, Nuno Guerreiro, Paulo Fonseca Teixeira, 2013 .

Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2013, J. Electron. Test..

A self-calibrated 10-bit 1 MSps SAR ADC with reduced-voltage charge-sharing DAC

Marcelino B. Santos, Jorge R. Fernandes, Cesar Ramos Rodrigues, 2013, 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013).

Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity

João Paulo Teixeira, Serge Pravossoudovitch, Christian Landrault, 1999, ISCAS'99. Proceedings of the 1999 IEEE International Symposium on Circuits and Systems VLSI (Cat. No.99CH36349).

Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2011, 29th VLSI Test Symposium.

Gate Driver Voltage Optimization for Multi-Mode Low Power DC-DC Conversion

Marcelino B. Santos, Nuno Dias, Pedro Braga, 2009, J. Low Power Electron..

Power and Performance Optimization in Long-term Operation

Marcelino B. Santos, Isabel C. Teixeira, C. Leong, 2014 .

Self-checking and fault tolerance quality assessment using fault sampling

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2002, 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings..

Design and Test of a Certifiable ASIC for a Safety-Critical Gas Burner Control System

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2002, J. Electron. Test..

RTL test pattern generation for high quality loosely deterministic BIST

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2003, 2003 Design, Automation and Test in Europe Conference and Exhibition.

Performance sensor for tolerance and predictive detection of delay-faults

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2014, 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2008, 2008 14th IEEE International On-Line Testing Symposium.

Analysis of a monolithic buck converter's pMOS switch during turn off

Marcelino B. Santos, José F. da Rocha, José M. Dores Costa, 2011, 2011 IEEE EUROCON - International Conference on Computer as a Tool.

Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2008, 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems.

On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2004, J. Electron. Test..

Fault-Tolerance in Field Programmable Gate Array with Dynamic Voltage and Frequency Scaling

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2015, J. Low Power Electron..

Defect-oriented test quality assessment using fault sampling and simulation

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-level

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

ActivIC: Design-Based Automatic Characterization of Mixed-Signal Integrated Circuits

Marcelino B. Santos, Tiago H. Moita, Carlos B. Almeida, 2013, J. Low Power Electron..

Noise Minimization for Low Power Bandgap Reference and Low Dropout Regulator Cores

Marcelino B. Santos, Nuno Dias, Angelo Monteiro, 2009, J. Low Power Electron..

On the design of a highly testable cell library

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1992, Microprocess. Microprogramming.

VHDL fault simulation for defect-oriented test and diagnosis of digital ICs

João Paulo Teixeira, Marcelino B. Santos, J. Ferreira, 1996, Proceedings EURO-DAC '96. European Design Automation Conference with EURO-VHDL '96 and Exhibition.

Implicit current DC-DC Digital Voltage-Mode Control

Marcelino B. Santos, Carlos Moreira, 2014, 2014 IEEE 23rd International Symposium on Industrial Electronics (ISIE).

FPGAs BIST Evaluation

João Paulo Teixeira, Marcelino B. Santos, Abilio Parreira, 2004, FPL.

Digital LQR control with Kalman Estimator for DC-DC Buck converter

J. Fernando A. da Silva, Marcelino B. Santos, Sónia Ferreira Pinto, 2011, 2011 IEEE EUROCON - International Conference on Computer as a Tool.

Time Management for Low-Power Design of Digital Systems

João Paulo Teixeira, Fabian Vargas, Marcelino B. Santos, 2008, J. Low Power Electron..

Signal Integrity Enhancement in Digital Circuits

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2008, IEEE Design & Test of Computers.

A probabilistic method for the computation of testability of RTL constructs

João Paulo Teixeira, Marcelino B. Santos, Arlindo L. Oliveira, 2004, Proceedings Design, Automation and Test in Europe Conference and Exhibition.

ICT: Interface software for the characterization and test of mixed-signal power cores

Marcelino B. Santos, Jorge O. M. Esteves, Tiago H. Moita, 2011, 2011 IEEE 17th International On-Line Testing Symposium.

Property coverage for quality assessment of fault tolerant or failsafe systems

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2003, 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003..

Defect-oriented IC test and diagnosis using VHDL fault simulation

João Paulo Teixeira, Marcelino B. Santos, J. Ferreira, 1996, Proceedings International Test Conference 1996. Test and Design Validity.

Test preparation for high coverage of physical defects in CMOS digital ICs

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1995, Proceedings 13th IEEE VLSI Test Symposium.

Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2005, J. Electron. Test..

Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2007, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007).

Functional-oriented mask-based built-in self-test

João Paulo Teixeira, Marcelino B. Santos, 2007, IET Comput. Digit. Tech..

On-Line BIST for Performance Failure Prediction Under NBTI-Induced Aging in Safety-Critical Applications

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2011, J. Low Power Electron..

On the analysis of routing, cells and adjacency faults in CMOS digital circuits

João Paulo Teixeira, Marcelino B. Santos, Fernando M. Gonçalves, 1994, IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.

Low-sensitivity to process variations aging sensor for automotive safety-critical applications

João Paulo Teixeira, Marcelino B. Santos, Ricardo Reis, 2010, 2010 28th VLSI Test Symposium (VTS).

Probabilistic Testability Analysis and DFT Methods at RTL

João Paulo Teixeira, Marcelino B. Santos, Arlindo L. Oliveira, 2006, 2006 IEEE Design and Diagnostics of Electronic Circuits and systems.

Modeling and simulation of time domain faults in digital systems

João Paulo Teixeira, Fabian Vargas, Marcelino B. Santos, 2004, Proceedings. 10th IEEE International On-Line Testing Symposium.

Low Power BIST by Filtering Non-Detecting Vectors

João Paulo Teixeira, Patrick Girard, Serge Pravossoudovitch, 1999, European Test Workshop 1999 (Cat. No.PR00390).

RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2001, J. Electron. Test..

Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2007, 2007 IEEE Design and Diagnostics of Electronic Circuits and Systems.

On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2007, 13th IEEE International On-Line Testing Symposium (IOLTS 2007).

Ultra-Low-Power Strategy for Reliable IoE Nanoscale Integrated Circuits

Marcelino B. Santos, Jorge Semião, J. Paulo Teixeira, 2019 .

Quality of electronic design: from architectural level to test coverage

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2000, Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525).

Aging-Aware Power or Frequency Tuning With Predictive Fault Detection

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2012, IEEE Design & Test of Computers.

Programmable aging sensor for automotive safety-critical applications

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2010, 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010).

Defect-oriented mixed-level fault simulation of digital systems-on-a-chip using HDL

João Paulo Teixeira, Marcelino B. Santos, 1999, DATE '99.

DFT and Probabilistic Testability Analysis at RTL

Marcelino B. Santos, Arlindo L. Oliveira, José M. Fernandes, 2006, 2006 IEEE International High Level Design Validation and Test Workshop.

RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2002, J. Electron. Test..

Functional-oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2006, 2006 IEEE Design and Diagnostics of Electronic Circuits and systems.

Performance Sensor for Reliable Operation

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2018, HCI.

TESTABILITY ISSUES IN THE CMS ECAL UPPER-LEVEL READOUT AND TRIGGER SYSTEM

Marcelino B. Santos, Jose A. Soares Augusto, Joao Varela, 2000 .

Applying Model Checking in the Verification of a Clock Masking Unit

Ricardo Chaves, Marcelino B. Santos, José M. Leitão, 2019, 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS).

RTL level preparation of high-quality/low-energy/low-power BIST

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2002, Proceedings. International Test Conference.

Digital Sliding Mode Control of DC-DC Buck Converters

Marcelino B. Santos, Carlos Moreira, Bruno Jacinto, 2011, J. Low Power Electron..

Aging monitoring with local sensors in FPGA-based designs

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2013, 2013 23rd International Conference on Field programmable Logic and Applications.

Modeling of Inherent Losses of Fully Integrated Switched Capacitor DC-DC Converters

Marcelino B. Santos, Fabian Rein, Christian Münker, 2012, J. Low Power Electron..

The influence of clock-gating on NBTI-induced delay degradation

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2012, 2012 IEEE 18th International On-Line Testing Symposium (IOLTS).

Enhancing the Tolerance to Power-Supply Instability in Digital Circuits

João Paulo Teixeira, Fabian Vargas, Marcelino B. Santos, 2007, IEEE Computer Society Annual Symposium on VLSI (ISVLSI '07).

Fault Simulation Using Partially Reconfigurable Hardware

João Paulo Teixeira, Marcelino B. Santos, José T. de Sousa, 2003, FPL.

Energy resolution of the barrel of the CMS Electromagnetic Calorimeter

Marcelino B. Santos, J. P. Teixeira, A. Lister, 2007 .

CMS Physics : Technical Design Report Volume 1: Detector Performance and Software

Marcelino B. Santos, Verguilov, Mossolov, 2006 .

CMS Physics Technical Design Report, Volume II: Physics Performance

Marcelino B. Santos, V. M. Ghete, W. J. Womersley, 2007 .

Test Scheduler : A Design Based Tool for Test Automation

Marcelino B. Santos, Tiago H. Moita, C. B. Almeida, 2012 .

Integration of the Characterization Test in the Design Flow

Marcelino B. Santos, Jorge O. M. Esteves, 2011 .

CMS : the TriDAS Project Technical Design Report; v.1, the Trigger Systems

João Paulo Teixeira, Marcelino B. Santos, Rita Almeida Ribeiro, 2004 .

Digital DCDC control with sliding mode control

Marcelino B. Santos, N. Horta, B. André, 2010 .

High PSRR , Low Power Bandgap

Marcelino B. Santos, B. Borges, Angelo Monteiro, 2008 .

CMS physics technical design report: Addendum on high density QCD with heavy ions

H. Stoeck, J. Yarba, F. Arteche, 2007 .

Energy Resolution Performance of the CMS Electromagnetic Calorimeter

Marcelino B. Santos, J. P. Teixeira, Adarsh K. Jain, 2006 .

CMS expression of interest in the SLHC

Marcelino B. Santos, W. J. Womersley, D. M. Raymond, 2007 .

Asynchronous Tracking ADC for Digitally Controlled DC-DC Converters

Marcelino B. Santos, Frederico Pratas, Marcelino Santos, 2011 .

A Click Modulation audio player

Marcelino B. Santos, Goncalo Tavares, Tiago Domingues, 2015, 2015 Conference on Design of Circuits and Integrated Systems (DCIS).

Low frequency PWM modulation for high efficiency Class-D audio driving

Marcelino B. Santos, Goncalo Tavares, Tiago Domingues, 2014, Design of Circuits and Integrated Systems.