Yibai He

Flip-flops soft error rate evaluation approach considering internal single-event transient

Shuming Chen, Ruiqiang Song, Yibai He, 2014, Science China Information Sciences.

A Scan Chain Based SEU Test Method for Microprocessors

Bin Liang, Yibai He, Yaqing Chi, 2013, NCCET.

Novel Layout Technique for N-Hit Single-Event Transient Mitigation via Source-Extension

Shuming Chen, Bin Liang, Yibai He, 2012, IEEE Transactions on Nuclear Science.

Novel Layout Technique for Single-Event Transient Mitigation Using Dummy Transistor

Shuming Chen, Bin Liang, Pengcheng Huang, 2013, IEEE Transactions on Device and Materials Reliability.

Mirror image: newfangled cell-level layout technique for single-event transient mitigation

Pengcheng Huang, Shuming Chen, Yibai He, 2014 .

Voltage Dependency of Propagating Single-Event Transient Pulsewidths in 90-nm CMOS Technology

Shuming Chen, Bin Liang, Yibai He, 2014, IEEE Transactions on Device and Materials Reliability.

Comparison of heavy-ion induced SEU for D- and TMR-flip-flop designs in 65-nm bulk CMOS technology

Shuming Chen, Yibai He, 2014, Science China Information Sciences.