Naomasa Shiraishi

Nikon F2 exposure tool development

Shigeru Sakuma, Yasuhiro Ohmura, Soichi Owa, 2003, SPIE Advanced Lithography.

Development of Method for Non-destructive Measurement of Nitrate Concentration in Vegetable Leaves by Near-infrared Spectroscopy

Hiromichi Itoh, Hirotsugu Tomita, Naomasa Shiraishi, 2011 .