Jean Marc Nicot

Space microsystems and reliability: The contribution of behavioral modeling

Jean-Yves Fourniols, Francis Pressecq, Henri Camon, 2004 .

Dynamic Laser Stimulation Case Studies

Romain Desplats, Philippe Perdu, Kevin Sanchez, 2005, Microelectron. Reliab..

Reliability analysis of CMOS MEMS structures obtained by Front Side Bulk Micromachining

Pascal Nouet, Vincent Beroulle, Laurent Latorre, 2002, Microelectron. Reliab..

Reliability issues of an accelerometer under environmental stresses

Francis Pressecq, Daniel Esteve, Henri Camon, 2003, SPIE MOEMS-MEMS.

Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling

Jean-Yves Fourniols, Patrick Pons, Francis Pressecq, 2003, Microelectron. Reliab..