Jan Van Houdt

发表

High-k materials for tunnel barrier engineering in future memory technologies

Pieter Blomme, Bogdan Govoreanu, Maarten Rosmeulen, 2004 .

A 25ns/byte-Programmable Low-Power SSI Flash Array with a New Low-Voltage Erase Scheme for Embedded Memory Applications

Ludo Deferm, Dirk Wellekens, Luc Haspeslagh, 1995 .

Novel small-area read-out circuit for multi-level memories

Dirk Wellekens, Herman Maes, Jan Van Houdt, 1997 .

(Invited) High-k Dielectrics and High Work Function Metals for Hybrid Floating Gate NAND Flash Applications

Geert Van den bosch, Pieter Blomme, Laurent Breuil, 2014 .

Write/Erase Degradation and Disturb Effects in Source Side Injection Flash EEPROM Devices

Dirk Wellekens, Jan Van Houdt, Guido Groeseneken, 1995 .

A 1Mbit HIMOS? flash memory embedded in a 0.35? m CMOS process

Ludo Deferm, Dirk Wellekens, Paul Hendrickx, 2000 .

Integration of HIMOS Flash Memory in a 90nm CMOS Technology

Luc Haspeslagh, Joeri De Vos, Jan Van Houdt, 2005 .

Analog In-memory Computing in FeFET-based 1T1R Array for Edge AI Applications

Jan Van Houdt, A. Mallik, Takayuki Ezaki, 2021, 2021 Symposium on VLSI Circuits.

Impact of mechanical strain on wakeup of HfO2 ferroelectric memory

I. De Wolf, Jan Van Houdt, Sergiu Clima, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).

Silicon scaling and its consequences for memory technology

Herman Maes, Jan Van Houdt, J. V. Houdt, 2003 .

How far can we analyze oxide traps spatially with charge injection techniques

Philippe Roussel, Guido Groeseneken, Ben Kaczer, 2008 .

Statistical model for SILC and pre-breakdown current jumps in ultra-thin oxide layers

Guido Groeseneken, Ben Kaczer, Robin Degraeve, 2001 .

RTN assessment of traps in polysilicon cylindrical vertical FETs for NVM application

Geert Van den bosch, Cor Claeys, Eddy Simoen, 2013 .

Failure Rate Prediction and Accelerated Detection of Anomalous Charge Loss in Flash Memories by Using an Analytical Transient Physics-Based Charge Loss Model.

Dirk Wellekens, Paul Hendrickx, Jan Van Houdt, 2002 .

Characterization of the spatial charge distribution in local charge-trapping memory devices using the charge-pumping technique

Laurent Breuil, Maarten Rosmeulen, Luc Haspeslagh, 2004 .

A consistent model for oxide trap profiling with the Trap Spectroscopy by Charge Injection and Sensing (TSCIS) technique

Eddy Simoen, Philippe Roussel, Guido Groeseneken, 2010 .

An effective model for analysing tunneling gate leakage currents through ultrathin oxides and high-k gate stacks from Si inversion layers

Pieter Blomme, Jan Van Houdt, Kristin De Meyer, 2004 .

Channel hot electron injection versus Fowler-Nordheim tunneling for multilevel charge storage in non-volatile memories

Guido Groeseneken, Dirk Wellekens, Paul Hendrickx, 1997 .

Electrical Defects in Dielectrics for Flash Memories Studied by Trap Spectroscopy by Charge Injection and Sensing (TSCIS)

Geert Van den bosch, Guido Groeseneken, Ben Kaczer, 2009 .

Spectroscopic study of polysilicon traps by means of fast capacitance transients

Eddy Simoen, Guido Groeseneken, Ben Kaczer, 2013 .