Gilson I. Wirth

发表

A variability-based analysis technique revealing physical mechanisms of MOSFET low-frequency noise

Thiago H. Both, Jeroen A. Croon, Mauricio Banaszeski da Silva, 2017, 2017 International Conference of Microelectronic Test Structures (ICMTS).

Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell Library

Gilson I. Wirth, Pablo Ilha Vaz, Thiago Hanna Both, 2018, J. Electron. Test..

Statistical analysis of hold time violations

Rajeev Murgai, William W. Walker, Ricardo Reis, 2010 .

Probabilistic Approach for Yield Analysis of Dynamic Logic Circuits

Ricardo Augusto da Luz Reis, Gilson I. Wirth, Lucas Brusamarello, 2008, IEEE Transactions on Circuits and Systems I: Regular Papers.

Compact modeling and simulation of Random Telegraph Noise under non-stationary conditions in the presence of random dopants

Gilson I. Wirth, Lucas Brusamarello, D. Vasileska, 2012, Microelectron. Reliab..

Statistical and Numerical Approach for a Computer efficient circuit yield analysis

Ricardo Reis, Gilson I. Wirth, Lucas Brusamarello, 2007, VLSI-SoC.

TID effects on I-V characteristics of bulk CMOS STD and ELT-based devices in 600 nm

Thiago H. Both, Gilson I. Wirth, Pablo Ilha Vaz, 2020, Microelectron. J..

Modeling the sensitivity of CMOS circuits to radiation induced single event transients

Fernanda Gusmão de Lima Kastensmidt, Gilson I. Wirth, Michele G. Vieira, 2008, Microelectron. Reliab..

A TCAD evaluation of a single Bulk-BICS with integrative memory cell

Bharat L. Bhuva, Ronald D. Schrimpf, Alexandre Simionovski, 2018, Microelectron. J..

Protecting digital circuits against hold time violation due to process variability

Ricardo Reis, Gustavo Neuberger, Gilson I. Wirth, 2009, SBCCI.

Circuit simulation of workload-dependent RTN and BTI based on trap kinetics

Tibor Grasser, Ben Kaczer, Gilson I. Wirth, 2014, Microelectron. Reliab..

A Framework for Electrical Test Engineering Automation

Sergio Bampi, Gilson I. Wirth, Ricardo Wartchow, 1995 .

The effects of total ionizing dose on the neutron SEU cross section of a 130 nm 4 Mb SRAM memory

Gilson I. Wirth, Thiago Hanna Both, Evaldo Carlos Fonseca Pereira, 2014, 2014 15th Latin American Test Workshop - LATW.

Single Event Transients in Combinatorial Circuits

Fernanda Gusmão de Lima Kastensmidt, Gilson I. Wirth, Michele G. Vieira, 2005, 2005 18th Symposium on Integrated Circuits and Systems Design.

Trim range limited by noise in bandgap voltage references

Sergio Bampi, Gilson I. Wirth, Dalton Martini Colombo, 2007, SBCCI '07.

Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability

Ricardo Reis, Felipe Rosa, Luciano Ost, 2015, 2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS).

Técnicas probabilísticas para análise de yield em nível elétrico usando propagação de erros e derivadas numéricas

Ricardo Augusto da Luz Reis, Gilson I. Wirth, Lucas Brusamarello, 2007, RITA.

A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping

Hans P. Tuinhout, Andries J. Scholten, Gilson I. Wirth, 2017, IEEE Transactions on Electron Devices.

“The flipped voltage follower”-based low voltage fully differential CMOS sample-and-hold circuit

Akira Matsuzawa, Jaime Ramírez-Angulo, Christian Jesús B. Fayomi, 2008, 2008 IEEE International Symposium on Circuits and Systems.

Statistical characterization of standard cells using design of experiments with response surface modeling

Philippe Roussel, Miguel Corbalan, Gilson I. Wirth, 2011, 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC).

Using built-in sensors to cope with long duration transient faults in future technologies

Luigi Carro, Fernanda Gusmão de Lima Kastensmidt, Gilson I. Wirth, 2007, 2007 IEEE International Test Conference.

Impact of Noise on Trim Circuits for Bandgap Voltage References

Sergio Bampi, Christian Jesús B. Fayomi, Gilson I. Wirth, 2007, 2007 14th IEEE International Conference on Electronics, Circuits and Systems.

Yield Analysis by Error Propagation Using Numerical Derivatives Considering WD and D2D variations

Ricardo Augusto da Luz Reis, Gilson I. Wirth, Lucas Brusamarello, 2007, IEEE Computer Society Annual Symposium on VLSI (ISVLSI '07).

Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs

Christopher Frost, Ricardo Reis, Pascal Benoit, 2014, Microelectron. Reliab..

A physics-based RTN variability model for MOSFETs

Gilson I. Wirth, Hans Tuinhout, Adrie Zegers-van Duijnhoven, 2014, 2014 IEEE International Electron Devices Meeting.

Mechanical deformation on nanoparticle-based thin-film transistors

Ulrich Hilleringmann, Gilson I. Wirth, Julia Reker, 2019, Conference on Sensors, MEMS and Electro-Optic Systems.

Generation and Propagation of Single Event Transients in CMOS Circuits

Fernanda Gusmão de Lima Kastensmidt, Gilson I. Wirth, Michele G. Vieira, 2006, 2006 IEEE Design and Diagnostics of Electronic Circuits and systems.

Fast and accurate statistical characterization of standard cell libraries

Philippe Roussel, Miguel Corbalan, Gilson I. Wirth, 2011, Microelectron. Reliab..

Deterministic Methodology for Electrical Simulation of BTI Induced Pulse Broadening

Thiago H. Both, Gilson I. Wirth, Gabriela Firpo Furtado, 2017, IEEE Transactions on Device and Materials Reliability.

Evaluating Fault Coverage of Bulk Built-in Current Sensor for Soft Errors in Combinational and Sequential Logic

Fernanda Gusmão de Lima Kastensmidt, Gilson I. Wirth, Michele G. Vieira, 2005, 2005 18th Symposium on Integrated Circuits and Systems Design.

An experimental 0.6-V 57.5-fJ/conversion-step 250-kS/s 8-bit rail-to-rail successive approximation ADC in 0.18µm CMOS

Akira Matsuzawa, David M. Binkley, Christian Jesús B. Fayomi, 2009, 2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009).

Device degradation and resilient computing

Peter Glösekötter, Gilson I. Wirth, Ulrich Greveler, 2008, 2008 IEEE International Symposium on Circuits and Systems.

Analysing the Impact of Aging and Voltage Scaling under Neutron-induced Soft Error Rate in SRAM-based FPGAs

Fernanda Lima Kastensmidt, Florent Bruguier, Pascal Benoit, 2014 .

Performance analysis of a clock generator PLL under TID effects

Gilson I. Wirth, Alan Carlos Junior Rossetto, Ricardo Vanni Dallasen, 2014, 2014 15th Latin American Test Workshop - LATW.

A PLL for clock generation with automatic frequency control under TID effects

Gilson I. Wirth, Thiago Hanna Both, Ricardo Vanni Dallasen, 2012, 2012 25th Symposium on Integrated Circuits and Systems Design (SBCCI).

Sub 1 V CMOS bandgap reference design techniques: a survey

Akira Matsuzawa, Gilson I. Wirth, Christian Fayomi, 2010 .

Design methodology using inversion coefficient for low-voltage low-power CMOS voltage reference

Christian Jesús B. Fayomi, Gilson I. Wirth, Dalton Martini Colombo, 2010, SBCCI '10.

Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs

Christopher Frost, Ricardo Reis, Pascal Benoit, 2014, 2014 19th IEEE European Test Symposium (ETS).

Low temperature fabrication of a ZnO nanoparticle thin-film transistor suitable for flexible electronics

Ulrich Hilleringmann, Gilson I. Wirth, Fábio Fedrizzi Vidor, 2014, Microelectron. Reliab..

Obtaining delay distribution of dynamic logic circuits by error propagation at the electrical level

Ricardo Augusto da Luz Reis, Gilson I. Wirth, Lucas Brusamarello, 2007, 2007 IFIP International Conference on Very Large Scale Integration.

Using Bulk Built-in Current Sensors to Detect Soft Errors

Fernanda Gusmão de Lima Kastensmidt, Gilson I. Wirth, Michele G. Vieira, 2006, IEEE Micro.

Statistical Analysis of Normality of Systematic and Random Variability of Flip-Flop Race Immunity in 130nm and 90nm CMOS Technologies

Ricardo Reis, Fernanda Gusmão de Lima Kastensmidt, Gustavo Neuberger, 2007, VLSI-SoC.

Modeling and simulation of the charge trapping component of BTI and RTS

Gilson I. Wirth, Thiago Hanna Both, Gabriela Firpo Furtado, 2018, Microelectron. Reliab..

Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors

Ulrich Hilleringmann, Gilson I. Wirth, Fábio Fedrizzi Vidor, 2018, 2018 IEEE 19th Latin-American Test Symposium (LATS).

Accurate and computer efficient modelling of single event transients in CMOS circuits

Fernanda Gusmão de Lima Kastensmidt, Gilson I. Wirth, Michele G. Vieira, 2007, IET Circuits Devices Syst..

Single event transients in dynamic logic

Fernanda Gusmão de Lima Kastensmidt, Gilson I. Wirth, Michele G. Vieira, 2006, SBCCI '06.

Bulk built in current sensors for single event transient detection in deep-submicron technologies

Gilson I. Wirth, 2008, Microelectron. Reliab..

NBTI-aware technique for transistor sizing of high-performance CMOS gates

Gilson I. Wirth, Lucas Brusamarello, Vinicius V. A. Camargo, 2009, 2009 10th Latin American Test Workshop.

Statistical RTS model for digital circuits

Gilson I. Wirth, Lucas Brusamarello, Roberto da Silva, 2009, Microelectron. Reliab..

Modeling the impact of RTS on the reliability of ring oscillators

Gilson I. Wirth, Maurício Banaszeski da Silva, 2010, SBCCI '10.

Adding a self-reset feature to the Bulk-BICS with dynamic storage cell

Alexandre Simionovski, Gilson I. Wirth, 2015, Microelectron. Reliab..

Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors

Fernanda Gusmão de Lima Kastensmidt, Gilson I. Wirth, Egas Henes Neto, 2008, J. Electron. Test..

Techniques for square ELT simulation: A comparative study

Gilson I. Wirth, Pablo Ilha Vaz, Alberto Wiltgen Junior, 2015, 2015 IEEE 6th Latin American Symposium on Circuits & Systems (LASCAS).

MagPDK: An open-source process design kit for circuit design with magnetic tunnel junctions

Gilson I. Wirth, Raphael Martins Brum, 2016, 2016 29th Symposium on Integrated Circuits and Systems Design (SBCCI).

Use of SSTA Tools for Evaluating BTI Impact on Combinational Circuits

Tibor Grasser, Guido Groeseneken, Ben Kaczer, 2014, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

A built-in current sensor for high speed soft errors detection robust to process and temperature variations

Fernanda Gusmão de Lima Kastensmidt, Gilson I. Wirth, Egas Henes Neto, 2007, SBCCI '07.

Deterministic methodology to evaluate BTI impact on logic gates propagation delay

Thiago H. Both, Gilson I. Wirth, Gabriela F. Furtado, 2017, 2017 32nd Symposium on Microelectronics Technology and Devices (SBMicro).

Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell

Alexandre Simionovski, Gilson I. Wirth, Rafael Galhardo Vaz, 2015, J. Electron. Test..

Impact of dynamic voltage scaling and thermal factors on SRAM reliability

Ricardo Reis, Fernanda Gusmão de Lima Kastensmidt, Felipe Rosa, 2015, Microelectron. Reliab..

Modeling and Simulation of Charge Trapping in 1/f Noise, RTN and BTI: from Devices to Circuits

Gilson I. Wirth, 2021, 2021 28th International Conference on Mixed Design of Integrated Circuits and System.

A Physics-Based Statistical RTN Model for the Low Frequency Noise in MOSFETs

Hans P. Tuinhout, Andries J. Scholten, Gilson I. Wirth, 2016, IEEE Transactions on Electron Devices.

Charge Trapping in MOSFETS: BTI and RTN Modeling for Circuits

Gilson I. Wirth, Jyothi Velamala, Ketul B. Sutaria, 2014 .

1/f noise simulation in MOSFETs under cyclo-stationary conditions using SPICE simulator

Dragica Vasileska, Gilson I. Wirth, Thiago Hanna Both, 2015 .

Autocorrelation Analysis as a Technique to Study Physical Mechanisms of MOSFET Low-Frequency Noise

Thiago H. Both, Jeroen A. Croon, Hans P. Tuinhout, 2017, IEEE Transactions on Electron Devices.

Novel analytical and numerical approach to modeling low-frequency noise in semiconductor devices

Gilson I. Wirth, Ralf Brederlow, Roberto da Silva, 2006 .