A. K. Sharma

Low dose rate radiation testing of advanced CMOS technology (AC/ACT) series parts for space flight applications

A. K. Sharma, K. Sahu, 1992, Workshop Record 1992 IEEE Radiation Effects Data Workshop.

Characterization of commercial high density memories under low dose rate total ionizing dose (TID) testing for NASA programs

A. K. Sharma, K. Sahu, 1997, 1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference.

Total ionizing dose (TID) evaluation results of low dose rate testing for NASA programs

A. K. Sharma, K. Sahu, S. Brashears, 1996, 1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference.