R. E. Shiner

Data Retention in EPROMS

R. E. Shiner, J. M. Caywood, B. L. Euzent, 1980, 18th International Reliability Physics Symposium.

A new reliability model for post-cycling charge retention of flash memories

R. E. Shiner, H. Belgal, N. Righos, 2002, 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).

Characterization and Screening of SiO2 Defects in EEPROM Structures

R. E. Shiner, N. R. Mielke, R. Haq, 1983, 21st International Reliability Physics Symposium.