H. Richter

Semiconductor diodes as neutron detectors for position-sensitive measurements and for application in personal neutron dosimetry

Michael Balzhaeuser, A. Dehoff, R. Engels, 1997, Other Conferences.

A new method and test structure for easy determination of femto-farad on-chip capacitances in a MOS process

H. Richter, B. Laquai, B. Hofflinger, 1992, ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures.

A modular 0.7 mu m CMOS JESSI test chip for multi purpose applications

H. Richter, G. Morin, T. Brenner, 1992, ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures.

A test structure for the measurement of fast internal signals in CMOS VLSI circuits

H. Richter, B. Laquai, B. Hoefflinger, 1995, Proceedings International Conference on Microelectronic Test Structures.