W. Anderson

A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies

S. Voldman, W. Anderson, R. Ashton, 1999, Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396).

Understanding the Thermodynamics of Direct Injection Spark Ignition (DISI) Combustion Systems: An Analytical and Experimental Investigation

W. Anderson, Jialin Yang, Diana D. Brehob, 1996 .