Qasim Abbas

A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes

Muhammad Saqlain, Jong Yun Lee, Qasim Abbas, 2020, IEEE Transactions on Semiconductor Manufacturing.

Controlled Surface Wettability by Plasma Polymer Surface Modification

Muzammil Iqbal, Qasim Abbas, Duy Khoe Dinh, 2019, Surfaces.