胡春媚

Anti-single event upset and anti-single event transient resettable scanning structure D trigger

陈建军, 郭阳, 梁斌, 2013 .

Scan Architecture d resettable flip-flops and anti-SEU single event transient

陈建军, 郭阳, 梁斌, 2013 .

Method for reducing power consumption of tested combination circuit in scanning test

刘蓬侠, 郭阳, 胡春媚, 2015 .

Multifunctional floating-point multiply and add calculation device for single instruction multiple data (SIMD) vector microprocessor

汪东, 唐涛, 陈书明, 2010 .