C.C.-H. Hsu

Addressable failure site test structures (AFS-TS) for process development and optimization

Sunnys Hsieh, K.Y.-Y. Doong, Sheng-Che Lin, 2000, ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095).

Anomalous reverse short-channel effect in p/sup +/ polysilicon gated P-channel MOSFET

C.C.-H. Hsu, Chun-Yen Chang, Chih-Yung Lin, 1994, IEEE Electron Device Letters.

Highly scalable ballistic injection AND-type (BiAND) flash memory

C.C.-H. Hsu, Ya-Chin King, Meng-Yi Wu, 2006, IEEE Transactions on Electron Devices.

A self-aligned inverse-T gate fully overlapped LDD device for sub-half micron CMOS

Yuan Taur, Tak H. Ning, Matthew R. Wordeman, 1989, International Technical Digest on Electron Devices Meeting.

Effects of X-ray irradiation on GIDL in MOSFETs

A. Balasinski, A. Acovic, C.C.-H. Hsu, 1992, IEEE Electron Device Letters.

Reduced hot-carrier reliability degradation of x-ray irradiated MOSFETs in a 0.25 μm CMOS technology with ultra-thin gate oxide

L. C. Hsia, A. Acovic, J. M. Aitken, 1993 .

A novel leakage current separation technique in a direct tunneling regime gate oxide SONOS memory cell

S.S. Chung, G. Chou, C.C.-H. Hsu, 2003, IEEE International Electron Devices Meeting 2003.

Voltage and Temperature Dependence of Interface Trap Generation by Hot Electrons in P- and N- Poly Gated MOSFETs

T. H. Ning, C.C.-H. Hsu, 1991, 1991 Symposium on VLSI Technology.

A numerical model for simulating MOSFET gate current degradation by considering the interface state generation

C.C.-H. Hsu, C. M. Yih, S. S. Chung, 1996, 1996 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD '96 (IEEE Cat. No.96TH8095).

Study of boron penetration through thin oxide with p+-polysilicon gate

Yuan Taur, C.C.-H. Hsu, J.Y.-C. Sun, 1989 .

Saturation transconductance of deep-submicron-channel MOSFETs

Yuan Taur, Ghavam G. Shahidi, Bijan Davari, 1993 .

A new approach to determine the effective channel length and the drain-and-source series resistance of miniaturized MOSFET's

Steve S. Chung, Jyh-Chyurn Guo, C.C.-H. Hsu, 1994 .