文
论文分享
演练场
杂货铺
论文推荐
字
编辑器下载
登录
注册
Guido. Groeseneken
发表
Trends and perspectives for electrical characterization and reliability assessment in advanced CMOS technologies
R. Degraeve, B. Kaczer, Guido. Groeseneken, 2010, 2010 Proceedings of the European Solid State Device Research Conference.