Murat Bozkurt

Sub-nanometer in-die overlay metrology: measurement and simulation at the edge of finiteness

Arie den Boef, Maurits van der Schaar, Kaustuve Bhattacharyya, 2013, Optical Metrology.

Investigation of the Stresses and Interaction Effects of Nozzle-Cylinder Intersections When Subject to Multiple External Loads

Asraf Uzzaman, Murat Bozkurt, David Nash, 2019 .

Speeding Up Cycle Based Logic Simulation Using Graphics Processing Units

Alper Sen, Baris Aksanli, Murat Bozkurt, 2011, International Journal of Parallel Programming.

Case Study: Seismic Rehabilitation of a Historical Building Using CUBC 97 Guidelines

Wenshen Pong, Murat Bozkurt, Mumtaz A. Nazir, 2005 .

Parallel Cycle Based Logic Simulation Using Graphics Processing Units

Alper Sen, Baris Aksanli, Murat Bozkurt, 2010, 2010 Ninth International Symposium on Parallel and Distributed Computing.

Color mixing in overlay metrology for greater accuracy and robustness

Arie den Boef, Kaustuve Bhattacharyya, John Lin, 2019, Advanced Lithography.

On-product overlay enhancement using advanced litho-cluster control based on integrated metrology, ultra-small DBO targets and novel corrections

Arie den Boef, Maurits van der Schaar, Kaustuve Bhattacharyya, 2013, Advanced Lithography.

Using Graphics Processing Units for Logic Simulation of Electronic Designs

Alper Sen, Baris Aksanli, Murat Bozkurt, 2010, 2010 11th International Workshop on Microprocessor Test and Verification.